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New Data Format Boosts Test Analytics

September 8 2020
Semiconductor Engineering's article highlighting the advances in data analytics with the proposed Rich Interactive Test Database (RITdb) standard coming from SEMI.  To support test operations, the CAST working group defined a streaming protocol for any data produced by a test cell component. This provides the meta-data about the test process that test factories can use to implement smart manufacturing.

“There’s a lot of flexibility in RITdb to handle multiple data sources,” said Mark Roos, CEO of Roos Instruments and co-chair of RITdb Taskforce. “This provides the flexibility to deal with the complexity of products that we have today.”

New Data Format Boosts Test AnalyticsNew Data Format Boosts Test Analytics
RITdb facilitates complex testing and enables new test floor analytics
September 8th, 2020 - By: Anne Meixner




Learn More about how Cassini and Guru implement various RITdb features.

Advancing ATE Strategy For mmWave Mass Market Production

March 19 2020
Cross posted:  https://roos.com/article_mmwave_journal_march2020.html

Mark Roos, CEO of Roos Instruments, published a technical feature article in March 2020 issue of Microwave Journal to promote Cassini platform that has addressed the critical issues surrounding mass market production of devices that use mmWave frequencies.

The automated test and measurement (ATE) landscape is rapidly changing, progressing beyond the capabilities of traditional bench-top and most legacy ATE systems. Varying and diverse performance requirements, testing speeds and frequencies used by modern cellular architectures (5G), Internet-of-Things (IoT) devices, and the latest feature dense systems-on-chip/systems-in-package (SoC/SiP) necessitate a different approach. This leverages a modular configuration focused on precise calibration, low loss device connections and high measurement accuracy with a small footprint and low capital expense. Modular architectures can provide future proof features and enable ATE systems to be faster and more accurate with less development. Not all modular ATE systems are created equal, however. At mmWave frequencies, test system configuration requires insight into the differentiating features between ATE systems as well as the bench-top units they typically replace.


Download the full article from Microwave Journal March 2020 Issue
View the
Microwave Journal March 2020 online edition (page 58)
Please contact
[email protected] for more information.


"Sensing Change" from Freescale CTO

August 7 2012
Article Republished from our Partner (link)
Ken Hansen
Ken Hansen
Freescale Chief Technology Officer



Did you know that Freescale delivered the world’s first silicon based pressure sensor for automobile engine control in 1980? Thirty years later, we are continuing this path of innovation by introducing the first fully integrated tire pressure monitor system. This System-in-a-Package senses the outside world through pressure, inertial, temperature, and battery life sensors, providing intelligence with an embedded microcontroller and software, and communicating to other systems through integrated RF and LF radio transceivers.

With more than one billion sensor units deployed in the field, Freescale continues delivering sensing firsts to the market. A recent automotive example is the 77 GHz radar silicon germanium (SiGe) integrated chipset—the most advanced SiGe on the market for active safety through collision avoidance. In the consumer market, Freescale is fueling the interactive video game revolution by deploying motion sensing accelerometers in the “Guitar Hero” series of games since 2008. Today, we’re innovating to make tomorrow’s products easier to use, arming them with embedded multicore processors and seamlessly integrated hardware and software with sensing support for up to 10 degrees of freedom.

Learn more about how our innovations in automotive, consumer, industrial, medical and multi-market applications can turbo-charge your solutions and, quite literally, add a human touch.

Read the white papers:

Consumer Transformation of Sensing to Address the Expanding Contextual World »
(PDF, 351 KB)
Auto Automotive Safety Innovations: When Will Zero Fatalities become a Reality? »
(PDF, 348 KB)




 

Modern ATE Alternative to Move Bench-Top to Production

June 2 2011
SANTA CLARA, June 2, 2011 - Roos Instruments reveals how Cassini reduces the overall time and cost of testing parts when compared to using bench-top equipment.
Image:Modern ATE Alternative to Move Bench-Top to Production
Moving from the Bench-Top to Production

High volume consumer end products and sub-assemblies have traditionally been tested on low cost, custom built, fully integrated bench-top equipment. These systems are typically created in-house and combine test resources from multiple vendors into a single test setup for a particular device. These custom solutions require considerable development effort, are focused on a particular device design, and require the designer to keep the tester capabilities up to date.   In high frequency cases, each setup can have unique interfaces and signal conditioning that requires specific setups, calibration requirements, and maintenance needs that all significantly increase the complexity and cost of test.

Continue Reading "Modern ATE Alternative to Move Bench-Top to Production" »

Roos Instruments Introduces Cassini for Microwave Power Amp IC and Module Testing

October 29 2009
SANTA CLARA, OCTOBER 29, 2009 - Roos Instruments, Inc.(RI) introduced a new configuration of the Cassini ATE platform optimized for production and engineering test of microwave Power Amplifier (PA) integrated circuits and modules. The new Cassini PA provides a complete test solution with best in class specifications and test time in a compact, cost effective package. With prices starting less than $300k and test times up to 10x faster than benchtop solutions, Cassini PA provides the fastest low cost solution for production and engineering labs alike.

Continue Reading "Roos Instruments Introduces Cassini for Microwave Power Amp IC and Module Testing" »

Presto Engineering and RI Collaborate for RF Product Engineering Services

September 16 2009

New RF, High Speed Digital, and Infrastructure Options for Roos Instruments’ CASSINI Introduced at Semicon West

July 9 2009
RI announced multiple additions to its two year-old modular Cassini Automated Test System adding to its available Test Instrument Modules (TIMs) .

Cassini16
is a new rack-less test system that allows 16 instruments to be used with the manipulator, system control software, and handler/prober interface for under $50,000 at zero pin count with Cassini RF systems starting at $300,000. The highly integrated Cassini16 provides nearly zero footprint when used with pick and place handlers or standard probers while offering single-site and multi-site test capabilities.

Simultaneously, RI is introducing additional Test Instrument Modules (TIMs) for its entire Cassini line. Each tester can be configured with multiple TIMs providing true parallel or shared resources based on device needs and cost targets.
Continue Reading "New RF, High Speed Digital, and Infrastructure Options for Roos Instruments’ CASSINI Introduced at Semicon West" »

Roos Instruments’ Cassini Tests Active Electronically Scanned Array Radar Modules

May 4 2009
Roos Instruments, Inc. announced the delivery of another production test solution for Active Electronically Scanned Array (AESA) Radar to a NATO defense contractor. AESA (phased array) Radars are used for both shipboard and airborne operations. Roos Instruments' Cassini test platform provides a significant improvement in test time and repeatability over pre-existing rack and stack equipment.

"Cassini's ability to measure accurate phase and amplitude on multiple RF and microwave ports provides the lowest cost of test to the high volume production of Active Array Radar Modules. Cassini's highly configurable hardware and software combined with an integrated vector calibration delivers the speed, accuracy and repeatability necessary for production test. A typical Active Array Radar Module customer will realize actual test time reductions up to 420%," said Mark Roos, Chief Engineer and CEO of Roos Instruments.
Continue Reading "Roos Instruments’ Cassini Tests Active Electronically Scanned Array Radar Modules" »

Roos Instruments Provides Freescale With High-Volume Production Test Solution for Emerging Automotive Radar Applications

February 10 2009
Technology leaders address ultra high frequency device testing with 77 GHz integrated high-speed production-ready solution

Roos Instruments, Inc. has provided Freescale Semiconductor with the world's first 77 GHz integrated high-speed ATE production solution. The production system consists of two new mm-wave Tester Instrument Modules (TIMs) that are additions to the RI7100C RF ATE System and a jointly developed blind mate Ultra High Frequency Test Fixture.

"While there has been some interest in past years in frequencies above 20 GHz, the recent advances in process technology combined with the imminent high volume applications in automotive radar and multimedia communications have accelerated the need for a high-volume manufacturing (HVM) test solution,” said Mark Roos, CEO of Roos Instruments. “Roos Instruments' expertise in this area combined with our configurable HVM platforms enable us to offer a truly production-ready solution."
Continue Reading "Roos Instruments Provides Freescale With High-Volume Production Test Solution for Emerging Automotive Radar Applications" »

STATS ChipPAC Partners with Roos Instruments to Provide Wireless Test Capability Using the 20 GHz RI7100A

January 21 2009
Roos Instruments, Inc.(RI) announced today that STATS ChipPAC Ltd.'s US Test Services group, a full-service semiconductor test development facility, has selected RI's RI7100A 20 GHz microwave and mixed signal tester to provide its customers with microwave test capability for wireless applications up to 20GHz. Applications include cellular handset devices, cellular infrastructure, wireless LAN, WAN and PAN, such as Bluetooth, 802.11, WiMax, Satellite TV, Cable TV set top boxes, and advanced high performance antenna switching devices. STATS ChipPAC's US Test facilities located in Milpitas, California offer customers access to high-end, richly configured test systems, as well as software and hardware development, wafer sort, final test and other backend services.
Continue Reading "STATS ChipPAC Partners with Roos Instruments to Provide Wireless Test Capability Using the 20 GHz RI7100A" »