 | CASSINI |
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| Part Number: | CASSINI |  |
| Description: | Cassini Multiport Test System | |
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| Cassini Modular ATE by RI | |
 | A Complete High Speed Automated
and Integrated Test Solution for:
- GSM and CDMA - 3G
- WirelessHD (60GHz to Baseband)
- Wafer, Package and Module
- Automotive Radar and Sensors
- General mmWave through 110GHz
- Wireless Infrastructure
- Wireless LAN 802.11a,b,g,n
- 4G - WiMax, LTE
- Bluetooth
- Cable TV
- Satellite TV
- Digital TV
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A major breakthrough in ATE architecture
- Cassini test systems consist of an extremely simple base system providing computer, power, software and docking capabilities.
- Additional test capability needed for virtually any type of IC, Wafer, or Module can be configured via Tester Instrument Modules (TIMS) that plug into the Test Head plate.
- Each TIM contains its own cooling, signal distribution and blind mate interface suited to its application.
- The result is the ability to configure a Cassini for any application with almost no system overhead. This is equally true for low pin count as well as high pin count test requirements
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| Operational Efficiency
Removing base system overhead creates a feature rich modular environment tailored to the needs of your current production environment.
Cost per TIM is on par with benchtop equipment allowing product engineers and operations managers to meet cost per device tested targets in multiple or single site test scenarios.
Cassinis can be easily updated and reconfigured in the field by swapping out or adding additional TIMs.
TIMs simplify spares planning (simply replace the TIM) which reduces Mean Time To Repair to minutes. |
Infrastructure Options
The three varieties of CASSINI Infrastructure allow for different combination of Infrastructure Tester Instrument Modules (Infrastructure TIMs). They vary in how many Infrastructure Source slots and TIM slots are available. Each size includes a manipulator arm to interface the Fixture with a handler, a handler interface pod, and a system controller with human interface devices (mouse, keyboard, and/or touch screen). Images are not to scale. All TIMs above 20Ghz require Large or Small Cassini.
  
# Slots: | Infrastructure Sources | TIM | Fixture Module |
Large | 3 | 8 | 10 |
Small | 1 | 8 | 10 |
Cassini 16 | 0 | 16 | 10 |
Available Tester Instrument Modules (TIMs)
Multiple TIMs can be configured per tester for maximum flexibility.
| Device Power Module TIM | |
- DC source and measurement for device test.
- Low speed static digital for managing test circuit configuration
- Pulsed 3 A current source and measure
- All dynamic features are synchronous
- Supports multi-site test
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- 8x 250 mA 4 quadrant supplies
- 4x 3A single quadrant pulsed supplies
- 16 Low Speed Digital lines
- 8 Voltage Measure Lines
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High Speed Digital Module | |
- 20 - 960 Pins (120 Pins per TIM)
- 100 MHz Clock and Data
- Synchronous Mixed Signal Performance
- Configurable for Data, CPU, Scan, Signal, Serial and Parallel
- Full Parametrics
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| Vector Rate | |
| Data Formats (NRZ) | 100k to 100M vector per second |
| Clock Formats (ZS) | 100 MHz max |
| Vector Depth |
| Scan (std)
Scan (opt)
Capture
Pattern(std) | 128 Mbits ( shared by bank of 20 pins )
1024 Mbits ( shared by bank of 20 pins )
512 kbits
16M vectors per pin |
| Pin edge timing |
| OTA
Rise/fall time
Min pulse width
Edge resolution
Edge sets
Edges
Jitter | 750 ps
2 ns
5 ns
20 ps
2
32 per bank of 20 pins
200 ps rms |
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Waveform Instrument TIM | |
- CW/Modulated IF signal source/measure
- Complex time domain waveform capture and analysis
- Modulation source
- Precision baseband signal source and measure
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- 2x 16 bit, 100 MHz Arbitrary Waveform Source
- 100 MHz Low Noise Clock Source
- Dual 14 Bit, 80 Msps Digitizer
- Rise/Fall, Duty Cycle Events Counter
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20 GHz Test Set TIM | |
- Provides a fully calibrated microwave path between the DUT board and the tester.
- Allows extension to multiple port structures via additional fixture.
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- 4 Full Performance RF Ports with
- Full Vector Measurement up to 20 GHz
- Supports External Synthesizer
- Supports External Digital Modulated Synthesizer
- Supports External Receiver
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20-40 GHz Test Set TIM | |
- Provides a fully calibrated microwave path between the DUT board and the tester.
- Allows extension to multiple port structures via additional fixture.
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- 2 Full Performance RF Ports with
- Full Vector Measurement from 20 to 40 GHz
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60 GHz Test Set TIM | |
- Source and Measure for WirelessHD
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- 2 Full Performance RF Ports with
- Full Vector Measurement from 55 to 65 GHz
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77 GHz Test Set TIM | |
- Source and Measure for Automotive Radar sensor IC's in wafer, package or module test
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- 2 Full Performance RF Ports with
- Full Vector Measurement from 65 to 80 GHz
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Custom TIM | |
| Please contact RI for information on custom TIMs. |
Cutting edge technology integrated with ATE capabilities |
Multiple TIMs can be configured per tester for maximum flexibility
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Related Documents: (user account required, register here)
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Cassini Footprint - 57 Large Infrastructure |
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Cassini Footprint - 56 Small Infrastructure |
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