This item will not be restocked when depleted and should be avoided for new designs.
This product entered limited availablity on 06/01/2011.
View RIKs with Limited Availability for a complete list.
Suggested Replacement: CASSINI
Expiration Reason: Next generation modular ATE improves on all RI7100A functionality.
Aditional replacements may be found by searching for RI7100A (change the REV letter) or RFIC ATE System.
RFIC ATE System
High Repeatablility, 3+ rack TIMs, Legacy Application Testing
Part Number: RI7100A
Customizing the RI7100A involves considering the following:
The number and type of power supplies needed.
The number and type of RF signals that need to be applied.
The power level of the RF signals to be applied.
The expected device RF output power.
The number and type of any digital control to be applied.
Download the RI7100A Performance Summary
| Details Measurement Capability General Information System Characteristics (pictures) Support Components | Download the RI7100A White paper |
Measurement Capability
The RI 7100A IFIC/RFIC ATE is a fully automatic IFIC/RFIC test system designed to test devices as simple as two port LNAs to integrated RF receivers with multiple frequency conversions, IQ modulators, frequency dividers, phase detectors, RSSI circuits, multiple gain steps, T/R switches, multiple biases, multiple I/O ports, and more.
S Parameters (<0.1 GHz to >8 GHz)Dynamic Range: >75 dB instantaneousNoise Figure (40 msec)
RF Power (< 100 usec)
The RI 7100A IFIC/RFIC ATE performs RF power measurements with the S parameter detection hardware in the RI System Receiver. The S parameter detection hardware has the capability to measure pulsed power signals. The system performs a complete RF power measurement in less than 100 usec.
Third Order Intercept (< 100 msec)1 dB Compression (< 25 msec)Spurious (-75 dBc in < 40 msec)Harmonics (-50 dBc in < 40 msec)RF and DC Pulsed Capability (35 usec pulse widths)RI 7100A IFIC/RFIC ATE General Information
The RI 7100A offers a flexible and expandable measurement platform. As your requirements expand and change, the RI 7100A will expand in performance and feature set to meet the new requirements.
Calibration TypesFast Test Plan Generation using the RI Graphical Test Plan Builder/EditorTest System ControllerMultiple Limit Files
Multiple limit files can be created with each test plan.
Test Plan Optimizer - Reduces Test Times
RI’s Test Plan Optimizer automatically reorders the tests in your test plan for maximum test speed (typically reducing test times by >30%.) The Test Plan Optimizer converts the test plan into low level measurements (such as wave parameters for S parameters). The Test Plan Optimizer then determines the time required to perform each measurement state change, identifies any duplicate measurement states, and then uses this information to restructure the test sequence for fastest execution. The resulting test sequence is compiled into executable code. All you have to do is press the RUN key to perform the testing.
Test Executive and Test Executive EditorSimultaneous Execution of Multiple Test Plans and Limit Files
Roos Instruments' IFIC/RFIC Test Executive provides the user the capability to run multiple test plans and limit files simultaneously on the same part.
Multiple Data ViewersData Logger Offers Multiple Data FormatsData Base Client Upgrade - Networking the Tester to Your Data BaseMultitasking Operating System
The system software is multitasking, allowing the user to open multiple viewers and perform multiple tasks simultaneously while time-sharing the test system hardware. In addition, the system software has the flexibility to allow the user to develop test plans without using the measurement hardware (simulation mode) and/or to develop test plans off-line on a separate computer.
S Parameter Auto-InterpolationRI Programmable DUT Controller
The RI Programmable DUT Controller provides the DC & pulsed bias, analog stimulus & measurement and the digital interface between the DUT and the System Computer. The RI DUT Controller is custom configured to each user's specific needs. Roos Instruments offers several plug-in application functions including:
- High Current Bias Supply Lines: 0 to 10 Vdc; 3.5 Amps max. per line, 35 us min pulse width.
- 6 Amp Current Bias Supply Lines: 0 to 10 Vdc; 6 Amps max per line, 35 us min pulse width.
- Medium Current Bias Supply Lines: < + 12 Vdc; 200 mA max. per line.
- Device Power Lines 1 - 8: 8 lines to 4 States (2 Medium Current Bias Supplies, an open or gnd.)
- Device Power Lines 9 thru 16: 8 lines to 3 States (2 Medium Current Bias Supplies or an open.)
- DUT Control Lines: Bi-State Levels, < + 10 Vdc.
- Add Current Measurement Capability to the DUT Control Lines: Adds VCCs 7 and 8.
- DC Voltage Measurement Lines: 12 bit Resolution.
- Low Noise Clock Output: Divides RF Input Signal by 64, Buffers & Outputs the Resulting Signal.
- Base Band Digitizer: Measures S/N, SINAD, Distortion, Rise/Fall, Timing, etc.
- Dual Output Arbitrary Waveform Synthesizer: 2 Analog & 2 Digital Outputs, DC to 10 MHz.
- Digital Frequency Counter : Measures BER and counts Digital Waveform Pulses to >1 Megabit rates.
Dual Output Arbitrary Waveform SynthesizerRF Test Ports (Expandable from 4 to 12 or more RF Ports)High RF Output Power RequirementsSystem Characteristics
| Universal Test Head Interface | Fixture on Test Head |
Standard Systems Include:
System Computer with OS/2 Operating System
Uninterruptible Power Source (UPS) for Complete System
System Rack, Test Head Manipulator, System Matrix & Cables
RF/Microwave System Receiver
RFIC/MMIC Test Head
Includes RF 2, 3, 6 & 7 (<100 MHz to >4 GHz) and RF 4 & 5 (<1 MHz to >500 MHz).
Programmable DUT Controller & Standard Plug-in Application Modules
Includes VI1, Vcc 1, 2, 3 & 4, Device Power Lines (DP 1-16),
Digital Control Lines (DB 1-8) with Current Measurement Capability,
Differential Voltage Measurement Lines (VM 1 - 4, 1N - 4N).
Synthesized Microwave Source (System LO)
Synthesized Microwave Source (RF Stimulus Source, RF Source 1)
Base Operating Environment, Software Utilities & Math Package
Graphical Test Plan Builder/Editor
Test Plan Optimizer
IFIC/RFIC Test Executive
RF Measurement & Calibration Software (S Parameters, Noise Figure & Power)
Auto-Interpolation of Calibration Data
RF Pulse Profiling
Source 2 routed to RF8
USB Flash memory support
System Installation
On-site System Training (first system only)
System FootprintInstallation RequirementsWeightSystem Warranty (1 year hardware / 90 day software)Training Technical Support Packages | |
"RI Standard Support" provides the recommended level of basic support for keeping test systems in compliance with world class quality standards. Other support options can be added to meet customer specific quality requirements.
PSR - RI Phone Support for Hardware Service and Repair (RIK0041A)
Phone and e-mail support for hardware repair and calibration issues.
SU - Software Updates (RIK0050A)
Software updates for new and/or improved measurement buttons, data viewers & worksheets, calibration, verification & diagnostic test plans, user interface functions, and editing tools. Software Updates are released electronically as needed and/or as requested by the user. Software Updates is priced according to the number of systems installed at one site. Site and Global licenses are available.
SILVER Technical Support
Includes STANDARD SUPPORT plus...
ME - Fast Ship Module Exchange (RIK0044A)
Roos Instruments will maintain replacement modules for the test system at Roos Instruments, Santa Clara, California. If a hardware failure occurs, Roos Instruments will ship, by the fastest method available, replacement modules to the test system.
The cost for the replacement module(s) to repair a hardware failure is included in Hardware Repair Replacement Parts (H