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Mark Roos
Roos Instruments, Santa Clara, Calif.

The automated test and measurement landscape is rapidly changing, progressing beyond the capabilities of traditional bench-top and most legacy ATE systems. Varying and diverse performance requirements, testing speeds and frequencies used by modern cellular architectures (5G), Internet-of-Things (IoT) devices, and the latest feature dense systems-on-chip/systems-in-package (SoC/SiP) necessitate a different approach. This leverages a modular configuration focused on precise calibration, low loss device connections and high measurement accuracy with a small footprint and low capital expense. Modular architectures can provide future proof features and enable ATE systems to be faster and more accurate with less development. Not all modular ATE systems are created equal, however. At mmWave frequencies, test system configuration requires insight into the differentiating features between ATE systems as well as the bench-top units they typically replace.

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