Programmable Device Control

16 Bit DC & Pulsed Bias (Force & Sense)

Three Unipolar 3 A VI's
Eight Bipolar 200 mA VI's
Two, 3x8 Channel Matrix
16 Bit DUT Digital Control (Serial & Parallel)
Switchable 2 mA Bipolar VI
12 Bit Voltage Measures Lines
Eight 50 K Samples/sec, Single or Differential
Analog Stimulus & Measurement (Including I & Q Tones)
2 channel 10 or 40 MHz 12 Bit Arbs
2 channel 90 MHz Digitizer
40 MHz DDS Sinewave Source

The Device Power Module TIM provides the DC pulsed bias, analog stimulus & measurement and the digital interface between the DUT and the test system. The Device Power Module can be custom configured for any specific Device requirements.

Device Power Module (DP,VM,DB,VI,VCC) - RI8546B

Description	Qty
High Current Bias Supply Lines: 0 to +10 Vdc; 3.0 Amps max. per line, 35 μs min pulse width.	2
Medium Current Bias Supply Lines: 0 to +/- 10 Vdc; 200 mA max. per line. 100μs Rise and Fall	4
Power Buffer Outputs: 0 to +/- 10 Vdc; 200 mA max.	2
Device Power Lines: 2 banks of 8 lines each, Medium Current Bias Supplies	16
Low Current Parametric Measurement Lines: VI Force and Sense, 2 mA max.	16
DUT Control Lines: Bi-State Levels, 0 + 10 Vdc. Up to 2 MHz max rate for I2C	16
DC Voltage Measurement Lines: 12 bit Resolution. (4 - differential / 8 - Single ended)	4/8

Time Domain Measurement (Waveform) - RI8521B

Description

Base Band Analyzer: Measures S/N, SINAD, Distortion, Rise/Fall, Timing, etc.

Arbitrary Waveform Synthesis: 2 Analog & 2 Digital Outputs, DC to 10 MHz or 40 MHz ( high speed version )

40 MHz DDS sine wave generator

Multiple lines/pins of each type can be added with additional TIMs. Additional functions and features can be easily added to the Test Head in the future as new TIMs become available.

Cassini Device Power Diagram




See the Cassini System Block Diagram (11x15") "Device Power" page in the Appendix.


Cassini Test Head RF Blind Mate Port ConnectionsA Cassini System can have many RF ports available at the Test Head interface through the high performance Cassini TIM 40 GHz RF blind Mate Male PKZ connectors One, two or four direct paths per TIM are available ( depending on the TIM ) with some capable of low frequency measurements below 100 MHz and others are full S-parameter capable ports for measurement between 100 MHz and 20 GHz, 40 GHz, or more depending on Test Set and Source capabilities. These will be discussed in more detail later in the seminar. The Cassini DC resources for Test Fixture power and 8 open collector Cbits are available in the center Test Head connector.


RI8545A Testset Block Diagram







The typical RF Test Set contains the couplers, microwave switches, Bi-state loads, RF attenuator, low noise amplifier and the noise source necessary to make multi-port S-parameter, RF power and noise figure measurements. To perform a stimulus/response measurement such as forward gain (S₂₁) DUT stimulus signals from the microwave sources are routed through the Test Set to the Device-Under-Test (DUT). The RF Test Set uses high speed microwave pin switches to selectively route the test signals received from the DUT to the System Receiver for measurement.


RI8545A Test Set Internals




Notice that the reflectometers that are created by special broadband microwave couplers are mounted in a compact block that is temperature controlled with the cables and switch paths of matched phase lengths. The oven effect of the closed Test Set provides the stable environment needed to maintain the RF calibration longevity. To minimize the temperature sensitivity of the Test Set, that is one of the major contributors to calibration drift, all of the microwave testing components are enclosed in a proportionally temperature controlled oven elevated to 38°C. The oven heated RF components allows for our unparalleled 12 month calibration cycle.

Test Set and Infrastructure RF Port Matrix

Note: Some capabilities are provided by other TIMs and some TIMs require the Large Infrastructure. Refer to the system specifications for details.

RF Ports Available

Port - Cassini Module Type	Resource
	Source	Receive	S Parameter	Noise Source	Noise Receive
RF2 - Test Set	X	X	X		X
RF3 - Test Set	X	X	X	X	X
RF4 - Measure		X			X
RF5 - Source	X
RF6 - Test Set	X	X	X	X	X
RF7 - Test Set	X	X	X	X	X

Test Set Frequency Ranges

RF Port	Test Set Model
	RI8545A	RI8547A	RI8563A	RI8564B	RI8565A w/ Pulse
RF2, RF3, RF6, RF7	100 MHz to 20 GHz	100 MHz to 6 GHz			100 MHz to 20 GHz
C4 (in), C8 (in/out)			20 - 40 GHz
C3 (Waveguide port)				75 - 81 GHz

Source and Measure Frequency Ranges

RF4 (RI8553A Measure)	10 kHz to 2 GHz
RF5 (Source)	10 kHz to Upper Tester Frequency

RF Source Capabilities
Depends on Cassini Source Modules and Infrastructure type. Up to 4 CW/Pulse sources, up to 2 Auxillary sources, and 1 internal noise source.

Sources	Ports
	RF2	RF3	RF5	RF6	RF7
Source 1	X	X	X	X	X
Source 2	X	X	X	X	X
Source 3	X
Source 4
Noise Source	X	X		X	X
Aux Input	X	X	X	X	X
Aux 2 Input	X	X	X	X	X