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The RI 7100A ATE system attributes have evolved over three generations. The latest generation offers improved test plan, fixture, and hardware repeatability between systems. The systems are classified as GEN 1, GEN 2 or GEN 3 corresponding to the system's primary attributes and production date. GEN 1 and GEN 2 systems are obsolete, not upgradable and have a limited supply of spare hardware equipment.



Test plan and fixture portability were not practical for previous generation systems because these systems were built to specific customer requirements and each system was a custom configuration. GEN 1 systems were shipped starting in 1992 and are custom configurations that require special test plans, fixtures and hardware support to interoperate with other systems. GEN 2 systems were shipped before 1999 and have semi-custom RF port configurations as well as different optional equipment and performance capabilities that may require test plan modifications to work even with other GEN 2 systems.

GEN 3 systems have identical standard configurations but may have different options installed. The options are standard to allow for fixture and test plan compatibility. For GEN 3 systems, RI will provide continued support for many years after the production date. New capablities to GEN 3 systems can be installed in the field to upgrade tester functionality and satisfy new customer requirements. GEN 3 systems are backward compatible so test plans written for GEN 2 testers will run on GEN 3 testers, but test plans written for GEN 3 testers may not run on GEN 2 testers.



GEN 1 - Obsolete

GEN 2 - Obsolete (<1999)

Calibrated RF Frequency

4 GHz

4 GHz, 6 GHz special

Receiver IF Gain

10 dB IF steps, 0 to 50 dB

10 dB IF steps, 0 to 50 dB

Test Head RF Attenuation

10 dB steps, 0-110 dB, Mechanical

10 dB steps, 0-40 dB, Mechanical

High Src Dynamic Range

Src 1,2,3,4 Water cooled

Src 1,2 Option Air Cooled

AM/FM modulation

N/A

N/A

Digital Modulation Control

N/A

Special Module Required

Pulsed RF Test Capability

Slow Rate 30 msec min pulse

Slow Rate 30 msec min pulse

Dual Channel ARB

Special Module, 5 MHz Clock

N/A

Dual Channel Digitizer

Special Module, 10 MHz Rate

N/A

Bit Error Rate measurements

N/A

N/A

Power VI's

Permanently connected

Permanently connected

Digital Bits ( DBs )

60 kHz max serial data speed

60 kHz max serial data speed

Serial Protocol

Standard Serial

Standard Serial

Parametric Measurements

No parametric measure

No parametric measure

VCC 1 and VCC 2

Permanently connected

Switched by DP 9-16

VCC 3 and VCC 4

Switched by DP 1-8

Switched by DP 1-9

VCC 5 and VCC 6

N/A

Permanently connected

VCC 7 and VCC 8

N/A

N/A

Voltage Measure Lines (VMs)

16 ( VM 1, 1N, ...8, 8N )

8 ( VM 1, 1N, ...4, 4N )
(VM 5-8N replaced by VCCs)

"I-Drive" Input

On Pogo Pin 71 (see *Note)

On Pogo Pin 71 (see *Note)

Handler Control Interface

Parallel Handler Interface

Parallel Handler Interface

On Wafer Test Capability

N/A

Custom Special Only

Test Head Fixture Mounting

Original-style spring (upgradable )

Original-style spring (upgradable)

Test Fixture Types

Standard

Standard

System Control Bus

Daisy Chain RIFL (Fiber Optics)

Daisy Chain RIFL (Fiber Optics)

System Module Cooling

Water Heat Exchanger

Air Flow
*Note: Must remove connection to Pin 71 if new Fixtures are to be used on older GEN 1 & 2 systems



GEN 3 - Current

Benefits of New Features

Calibrated to RF Frequency

6 GHz (12 GHz and 20 GHz as options)

May be required for 802.11b or modeling

Receiver IF Gain

6 dB IF steps (can simulate 10 dB steps for compatibility), 20-56 dB

Improved sensitivity, dynamic range, accuracy & repeatability.

Test Head RF Attenuation

10 dB steps, 0-30 dB, Electronic and on all paths

Faster control, more flexibility and longer life

High Src Dynamic Range

Src 1,2,3 Option Air Cooled

Improved reliability

AM/FM modulation

Optional for Source 1

Required for Bluetooth

Digital Modulation Control

Standard Option for Source 1&2 Module

Required for ACPR testing

Pulsed RF Test Capability

Slow Rate 30 msec pulse Standard, High Rate optional

Required for Radar and PA Testing

Dual Channel ARB

10 MHz or 40 MHz Clock Options

Required for WLAN parts

Dual Channel Digitizer

90 MHz Bandwidth


Bit Error Rate measurements

10 MHz BER Option For Digitizer

Required for Bluetooth

Power VI's

Switched, normally disconnected

Better low current measurement.

Digital Bits ( DBs )

2.5 MHz max serial data speed

Higher Data Rate Serial Control

Serial Protocol

Standard, I2C, I3C, SPI Serial,


Parametric Measurements

Switchable parametric measure to 10 Nano-amps standard (100 pico-amps optional)

Very low current capability for continuity and leakage testing

VCC 1 and VCC 2

Switched by DP 9-16


VCC 3 and VCC 4

Switched by DP 1-8

Greater Functionality.

VCC 5 and VCC 6

Permanently connected


VCC 7 and VCC 8

Permanently connected (Optional)


Voltage Measure Lines ( VMs)

8 ( VM 1, 1N, ...4, 4N )

Made room for more Device Power Lines (DP's)

"I-Drive" Input

N/A (Pogo pin 71 was changed to GND)

(see *Note)

Handler Control Interface

Serial, parallel or GPIB handler interface

Supports more types of handlers.

On Wafer Test Capability

Standard Option

Support On-wafer testing

Test Head Fixture Mounting

New-style cam type mounting

More robust fixture dock.

Test Fixture Types

Standard, Universal, "Smart Fixture", or Multisite

Capable of Multi-site and Ping Pong Solutions


"Smart Fixture" extends the RIFL2 System Modules advanced capability to the Test Fixtures

Provides cost effective high speed digital part testing and expanded control to existing testers.

System Control Bus

Star Wired RIFL2: 10 MBits/sec

Faster test execution times

System Module Cooling

Air Flow

Reduced complexity and less maintenance
*Note: Must remove connection to Pin 71 if new Fixtures are to be used on older GEN 1 & 2 systems

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