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Teradyne has made their data file formats public to encourage their use as vendor-independent file formats for semiconductor test data. Their formats are the "Standard Teradyne Data Format" (STDF) and the "ASCII Teradyne Data Format" (ATDF). Although not indicated in the name, the STDF file format is a compressed binary format.



The RI Test Executive can log data during testing to either or both file types. This optional capability is enabled by filing in the patch file below and saving the image. The log file format is controlled from within the Package or Wafer Executive by the menu selection "Options/Data Saving...".

ATDF and STDF (referred herein as 'xTDF') files are nearly identical except for their coding -- ASCII vs. binary. Both files are written by the same class and share the same features.

* Test numbering in the xTDF file preserves the outline-structured style of the RI Tester by assigning the indexes to fixed-width fields. The number 1.1.1.1 is assigned the index 010101001, while the number 4.2.1.12 is assigned 040201012. These numbers are unique and their sequence monotonic.

* Test names, limit names and values, operator name (initials), etc. are all mapped to their equivalent xTDF fields.

* Test conditions are appended to each test name for tests with multiple test states. For example, a VSWR test might be named: [email protected]:100,Pwr1:-10.

* Log files are written to the 'Testdata' directory, by default C:\RiApps\Testdata. STDF files are written to ...\stdf\*.std and ATDF files are written to ...\atdf\*.atd. The name of the file is an 8-character string that encodes the date and time the data were taken. The names, when sorted lexically, also are sorted in time sequence.

* xTDF files have the ability to record both test limits and specification limits. The RI tester does not explicitly support spec limits, so they are not in the xTDF log file. (Our "histogram" limits are close, but are not necessarily the same as the spec limits.)

* Scaling is applied to current and frequency measurements. Currents are scaled to 'mA' (10e-3) and frequencies are scaled to MHz (10e6). All other measurements are written in default units.

* Test "alarms" are not implemented.

* RI test "categories" are mapped to xTDF "soft bins" as follows: "Standard Pass" is given the value 0, and all other (failing) categories are mapped to positive integers. "Standard Fail" is 1, "Special Fail 1" is 31, and other "Special Fails" follow numerically.

* RI handler "bins" are mapped to xTDF "hard bins". The handler bin number is used directly as the xTDF hard bin number.

The xTDF log facility is installed by performing a "patch" with the file XTDF.X01 below. Start with a clean booted image, become a Programmer, select Program/Patch... and select the patch file. The file is read in and the image saved with the changes added. This selection will exit the RI Test Executive after completion, so you will need to start it again to test the feature.

Two example files are included in the attachments below, one ATDF and one STDF file. They are for the same lot (simulated data) and their measurements match up. The ATDF file is plain text and readable by any text editor.

xtdf.x013xjxnh04.std3xjxnh02.atd


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