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5G Towers, Repeaters, Devices

5G Devices (or Similar)

Part Number: 5G-CASSINI

In Stock:

Estimated Restocking Time: Contact Factory

Cassini Modular ATE for 5G Device Testing by RI
Cassini 16A Complete High Speed Automated
and Integrated Test Solution for:
  • Full frequency coverage (20, 40, 60, 80 GHz)
  • PA Testing for Wafer, Package and Module format.
  • Full S-Parameter Coverage
  • P1dB
  • Fixed Pout
  • IM3
  • Leakage Current
  • Efficiency
  • Bit Error Rate (BER)
  • EVM modeling

Recommended Tester Instrument Modules (TIMs) for 5G testing

Device Power
DC source and measurement for device test
Low speed static digital for managing test circuit configuration
Pulsed 3 A current source and measure
All dynamic features are synchronous
Supports multi-site test
8x 250 mA 4 quadrant supplies
4x 3A single quadrant pulsed supplies
16 Low Speed Digital lines
8 Voltage Measure Lines

56-67 GHz Test Set
Provides a fully calibrated microwave path between the DUT board and the tester.
Allows extension to multiple port structures via additional fixture.
4 Full Performance RF Ports with
Full Vector Measurements from 56-67 GHz
Supports External Synthesizer
Supports External Digital Modulated Synthesizer
Supports External Receiver

Time Domain Measurement (Waveform)
Dual Arbitrary Waveform Synthesizer
Dual Digitizer (Oscilloscope)
Dual Sine Wave Sources
Full 2 port measurements on all instruments
640 MHz clock rate, 1 Hz min, 4000 dynamic points or pre-compiled 2 million sample waveform
Digitizers run at 80 MS/Sec
Synchronized Sine waves 90 MHz

20 Ghz Receiver
100 MHz to 6 GHz (usable from 70 MHz to 20 GHz)< -100 dBm to +30 dBm
< 1 Hz Resolution

Custom TIM
Please contact RI for information on custom TIMs.YOUR cutting edge technology integrated with full ATE capabilities

Multiple TIMs can be configured per tester for maximum flexibility.