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Automotive Radar

mmWave, Automotive Radar

Part Number: AUTO-CASSINI

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Cassini Modular ATE for Automotive Radar Testing by RI
Cassini 16
A Complete High Speed Automated
and Integrated Test Solution for:
  • Automotive Radar
  • 77 GHz, 40 GHz
  • Full S-Parameter Coverage
  • P1dB
  • Fixed Pout
  • IM3
  • Leakage Current
  • ACPR/ACLR
  • Efficiency
  • Add TIMs to do Multisite

Recommended Tester Instrument Modules (TIMs) for AUTOMOTIVE RADAR testing

Device Power
DC source and measurement for device test
Low speed static digital for managing test circuit configuration
Pulsed 3 A current source and measure
All dynamic features are synchronous
Supports multi-site test
8x 250 mA 4 quadrant supplies
4x 3A single quadrant pulsed supplies
16 Low Speed Digital lines
8 Voltage Measure Lines

4-40 GHz Test Set
Provides a fully calibrated microwave path between the DUT board and the tester.
Allows extension to multiple port structures via additional fixture.
2 Full Performance RF Ports with
Full Vector Measurements from 4-40 GHz
Supports External Synthesizer
Supports External Digital Modulated Synthesizer
Supports External Receiver

56-67 GHz Test Set
Provides a fully calibrated mmWave path between the DUT board and the tester.
Allows extension to multiple port structures via additional fixture.
2 Full Performance RF Ports with
Full Vector Measurements from 56-67 GHz
Supports External Synthesizer
Supports External Digital Modulated Synthesizer
Supports External Receiver

Time Domain Measurement (Waveform)
Dual Arbitrary Waveform Synthesizer
Dual Digitizer (Oscilloscope)
Dual Sine Wave Sources
Full 2 port measurements on all instruments
640 MHz clock rate, 1 Hz min, 4000 dynamic points or pre-compiled 2 million sample waveform
Digitizers run at 80 MS/Sec
Synchronized Sine waves 90 MHz

20 Ghz Receiver
100 MHz to 6 GHz (usable from 70 MHz to 20 GHz)< -100 dBm to +30 dBm
< 1 Hz Resolution

High Speed Digital Module
20 - 1200 Pins (120 Pins per TIM)
100 MHz Clock and Data
Synchronous Mixed Signal Performance
Configurable for Data, CPU, Scan, Signal, Serial and Parallel
Full Parametrics
Vector Rate
Data Formats100k to 100M vector per second
Clock Formats (ZS)100 MHz max
Vector Depth
Scan (std)
Scan (opt)
Capture
Pattern(std)
128 Mbits ( shared by bank of 20 pins )
1024 Mbits ( shared by bank of 20 pins )
512 kbits
16M vectors per pin
Pin edge timing
OTA
Rise/fall time
Min pulse width
Edge resolution
Edge sets
Edges
Jitter
750 ps
2 ns
5 ns
20 ps
2
32 per bank of 20 pins
200 ps rms

Custom TIM
Please contact RI for information on custom TIMs.
  • YOUR cutting edge technology integrated with full ATE capabilities

  • Multiple TIMs can be configured per tester for maximum flexibility, like upgrading to multi-site testing.