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60 GHz WiGig Devices

60 GHz, WiGig, WiHD, 802.11ad, Wireless USB, ECMA-387, IEEE 802.15.3c

Part Number: WIGIG-CASSINI

In Stock:

Estimated Restocking Time: Contact Factory

Cassini Modular ATE for WiGig (60 GHz) Testing by RI
Cassini 16
A Complete High Speed Automated
and Integrated Test Solution for:
  • WiGig
  • WiHD
  • Wireless USB
  • 60 GHz
  • Full S-Parameter Coverage
  • P1dB
  • Fixed Pout
  • IM3
  • Leakage Current
  • ACPR/ACLR
  • Efficiency

Recommended Tester Instrument Modules (TIMs) for WiGig testing
Multiple TIMs can be configured per tester for maximum flexibility, like upgrading to multi-site testing!
Device Power Module TIM
  • DC source and measurement for device test
  • Low speed static digital for managing test circuit configuration
  • Pulsed 3 A current source and measure
  • All dynamic features are synchronous
  • Supports multi-site test
  • 8x 250 mA 4 quadrant supplies
  • 4x 3A single quadrant pulsed supplies
  • 16 Low Speed Digital lines
  • 8 Voltage Measure Lines

57-64 GHz Test Set TIM
  • Provides a fully calibrated microwave path between the DUT board and the tester.
  • Allows extension to multiple port structures via additional fixture.
  • 4 Full Performance RF Ports with
  • Full Vector Measurements from 57-64 GHz
  • Supports External Synthesizer
  • Supports External Digital Modulated Synthesizer
  • Supports External Receiver

Time Domain Measurement (Waveform)
  • Dual Arbitrary Waveform Synthesizer
  • Dual Digitizer (Oscilloscope)
  • Dual Sine Wave Sources
  • Full 2 port measurements on all instruments
  • 640 MHz clock rate, 1 Hz min, 4000 dynamic points or pre-compiled 2 million sample waveform
  • Digitizers run at 80 MS/Sec
  • Synchronized Sine waves 90 MHz

6 GHz Source with Amp Attenuator
  • 100 MHz to 6 GHz (usable to 20 GHz)
  • -120 dBM to +22 dBm
  • 1 Hz Resolution

20 Ghz Receiver
  • 100 MHz to 6 GHz (usable from 70 MHz to 20 GHz)
  • < -100 dBm to +30 dBm
  • < 1 Hz Resolution

Custom TIM
Please contact RI for information on custom TIMs.
  • YOUR cutting edge technology integrated with full ATE capabilities

  • Multiple TIMs can be configured per tester for maximum flexibility.